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2017 Automated Test Summit Vietnam

VIET | ENG

Automated Test Summit 2016

Automated Test Summit, Vietnam

Date: 15th June 2017
Time: 8:30am – 1:30pm
Venue: Novotel Saigon
Address: 167 Hai Ba Trung Street, District 3 Ho Chi Minh City, Vietnam

The engineers in National Instruments here would like to extend a special invitation to you to attend our 2017 Automated Test Summit, a complimentary half day technical event featuring new technologies and innovative approaches for building smart, cost effective automated test systems for Automotive HIL, RF and mixed signal semiconductor test of devices such as RF power amplifiers, MEMS accelerometers, and power management ICs.

Test engineering faces expanding requirements and unprecedented business constraints that affect time to market, cost of test, and staffing levels. As devices become more complex, engineers need to increase the throughput of their test systems, reduce maintenance costs, and explore lower cost solutions.

Learn how NI’s platform approach can prepare you for the test implications of these emerging technologies and how you can reduce your characterization and final manufacturing test costs and time to market. Discover how hundreds of companies build better automated test and measurement systems with a software-defined approach.

 

At the event, you can:

  • Explore PXI, an industry leading, PC-based platform used to build compact, high-performance automated test systems
  • Learn how NI uses platform-based approach to reduce test time and overall system cost
  • Learn why the NI Semiconductor Test System is the best platform to increase the throughput of your test system while reducing test cost.
  • Learn how the new Digital Pattern Instrument and the Second Generation Vector Signal Transceiver can improve your tests and test data
  • View live demonstrations of LabVIEW and TestStand software using a variety of modular instruments to perform functional tests on a unit under test

Why you should attend

This summit is designed for test engineers who are new to National Instruments automated test platform. It provides an overview of using LabVIEW for test, which would apply best to those who build test, measurement, or research and analysis applications. If you are looking for ways to increase the throughput of your test systems, reduce your maintenance costs, and explore lower cost solutions, this is the right place to be.

 

  

Please note that registration is required to attend this complimentary event.

 

Smart devices are creating an inflection point in automated test for both the test managers and engineers challenged with ensuring the quality of these devices at increasingly lower costs. To test their smart devices, organizations are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems on the PXI platform that scale with escalating requirements to continually shorten time to market and drive down cost.

These technical sessions include:

8:00am Registration
8:30am
 

Keynote: Lowering the Cost of Test while Improving Time-To-Market with a Platform-based Approach
Jareon Phetmunee, Area Sales Manager of Thailand, Vietnam & Myanmar, National Instruments 

The traditional closed approach of boxes in labs and ATE in production, although still prevalent in many IC companies, is not scaling up to the demands of smart devices. This disconnected approach itself is becoming a business risk in order to meet both time to market and cost demands. NI’s single platform approach, streamlined across all phases of test from lab to production floor open the doors for leverage and productivity gains never possible before, ultimately helping IC makers meet the key business needs of faster time to market and lower cost.

9:30am

Efficient Cellular, WLAN and Bluetooth Test
Phan Quoc Hung, District Sales Manager, National Instruments

The Internet of Things is driving the need for fast, accurate and lower-cost wireless manufacturing test. Built for the multi-standard, multi-DUT and multi-port test requirements of today and tomorrow, the Wireless Test System (WTS) excels where traditional approaches fall short. In this session, we review the wireless standards and economics driving wireless production test and how NI partners and customers use the WTS to reduce costs and multiply throughput. 

10:00am

Morning Tea Break

10:30am

FCT Tester – Functional Test System utilizing LabVIEW, TestStand and measurement hardware from National Instruments
Mr. Hoàng Thanh Nhã, R&D Team Leader, ASTI 

Explore key techniques and considerations that needs to be taken into account in designing and implementing a PCBA automated test system. Learn how ASTI Electronics Corporation successfully reduced investment cost and improve their test productivity using NI’s hardware and software solutions as compared to traditional test equipment.

11:00am

Identifying the Hardware Platform for Measurement Needs
Nguyen Van Nghia, Field Applications Engineer, National Instruments 

Learn how to scope your system using the measurement requirements for your device(s) under test. From these requirements, evaluate the best test platform to serve as the core of your system to accommodate current and future instrumentation needs.

11:30am

Evaluating Test Management Software
Nguyen Quy Nhon Phan, Applications Engineer, National Instruments

Learn to implement scalable test software through modular and open architectures that you can use off the shelf or completely customize. Explore best practices for using a test executive within your organization to maximize resources. 

12:00pm

Lunch

 

 

With the proven benefits of reducing cost, size, and footprint, the adoption of PXI-based semiconductor production test systems to address DC, Mixed Signal, RF & Digital Tests are on the rise. Even with hundreds of these systems already deployed, building your own test system is not a trivial task. It requires a team of engineers to build and support it, and most companies can't justify it. What you really need is a system that easily integrates into the production environment. See how NI has further evolved PXI to address this problem with the release of the Second Generation VST & Digital Pattern Instruments.

 

Bringing Semiconductor ATE-Class Digital to the Open PXI Platform

The PXI Digital Pattern Instrument delivers ATE-class digital to the industry-standard PXI platform for testing a broad range of RF and mixed-signal integrated circuits (ICs). The NI PXI platform and NI Semiconductor Test System (STS) are an ideal platform for characterization and production test of RF and mixed-signal ICs from RF front ends and power management ICs to transceivers and Internet of Things systems on chip with built-in connectivity and sensors.

Learn more about DPI
See the DPI in Action

Build your Test Applications with NI PXI and TestStand

Smart devices are creating an inflection point in automated test for both the test managers and engineers challenged with ensuring the quality of these devices at increasingly lower costs, and the vendors that serve them. To test their smart devices, organizations are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems that scale with escalating requirements to continually shorten time to market and drive down cost. The industry is taking advantage of the latest technologies, such as FPGAs, to meet increasing device complexity, configuring them in software to create customized testing solutions for their evolving system requirements and needs.

Learn more about PXI
See the PXI in Action

 

 

The Future of RF Design & Test Systems

NI’s second-generation PXI Vector Signal Transceiver (VST) offers 1 GHz of instantaneous RF bandwidth for signal generation and analysis. The PXIe-5840 VST combines a 6.5 GHz RF vector signal generator, 6.5  GHz vector signal analyzer, user-programmable Virtex-7 690T FPGA, and high-speed serial interface into a single 2-slot PXI module. Built on the LabVIEW reconfigurable I/O (RIO) architecture, it delivers programming flexibility and cutting-edge RF hardware to help you meet the most challenging RF applications.

Learn more about VST 2.0
See the VST 2.0 in Action

 

 

 

Date: 15th June 2017
Time: 8:30am – 1:30pm                     
Venue: Novotel Saigon                                                                                                        Address:
167 Hai Ba Trung Street, District 3 Ho Chi Minh City, Vietnam